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Orem, UT, United States

Kanyal S.S.,Brigham Young University | Jensen D.S.,Diamond Analytics | Zhu Z.,Pacific Northwest National Laboratory | Linford M.R.,Brigham Young University
Surface Science Spectra | Year: 2015

The authors report the time-of-flight secondary ion mass spectrometry of Si (100)/SiO2. Both positive and negative ion spectra were obtained using a cluster ion source (Bi32+ primary ions at 50 keV). Si+ is the base peak in positive ion mode. The negative ion spectrum shows signals characteristic of the native oxide: SiO2-, SiO2H-, SiO3-, and SiO3H-. © 2015 American Vacuum Society. Source


Kanyal S.S.,Brigham Young University | Jensen D.S.,Diamond Analytics | Zhu Z.,Pacific Northwest National Laboratory | Linford M.R.,Brigham Young University
Surface Science Spectra | Year: 2015

The authors report the positive and negative ion time-of-flight secondary ion mass spectrometry spectra obtained with Bi3 2+ primary ions at 50keV of an Fe film annealed in hydrogen at 750°C to form Fe nanoparticles. This surface had been exposed to the air; it had previously been shown by x-ray photoemission spectroscopy to be entirely oxidized. The strongest signal in the positive ion spectrum corresponded to Fe+, with FexOyHz + species also present. A substantial Al+ signal was observed due to exposure of the underlying alumina substrate. The negative ion spectrum showed O-, OH-, and AlO-. © 2015 American Vacuum Society. Source


Kanyal S.S.,Brigham Young University | Jensen D.S.,Diamond Analytics | Zhu Z.,Pacific Northwest National Laboratory | Linford M.R.,Brigham Young University
Surface Science Spectra | Year: 2015

The authors report the positive and negative ion time-of-flight secondary ion mass spectrometry characterization of a thin film of e-beam evaporated alumina on a silicon substrate using Bi3 ++ primary ions at 50 keV, where this film prevents poisoning of a Fe catalyst in carbon nanotube growth. The positive ion spectrum showed a strong Al+ signal, while the negative ion spectrum showed strong peaks due to AlO-, AlO2 -, AlO3H2 -, and OH-. © 2015 American Vacuum Society. Source


Kanyal S.S.,Brigham Young University | Jensen D.S.,Diamond Analytics | Zhu Z.,Pacific Northwest National Laboratory | Linford M.R.,Brigham Young University
Surface Science Spectra | Year: 2015

The authors report the positive and negative ion time-of-flight secondary ion mass spectrometry spectra using Bi32+ primary ions at 50 keV of an Fe film (6 nm) that had been thermally evaporated on a thin film of alumina (ca. 35 nm) on a silicon wafer. This surface had been exposed to the air; it had previously been shown by x-ray photoemission spectroscopy (XPS) to be entirely oxidized. The positive ion secondary ion mass spectrometry spectrum shows Fe+, FeH+, and FexOyHz+ species. The negative ion spectrum shows FeOH-, FexOyHz-, and OH- species. © 2015 American Vacuum Society. Source


Kanyal S.S.,Brigham Young University | Jensen D.S.,Diamond Analytics | Zhu Z.,Pacific Northwest National Laboratory | Linford M.R.,Brigham Young University
Surface Science Spectra | Year: 2015

The authors report the time-of-flight secondary ion mass spectrometry of carbon nanotubes grown catalytically from iron nanoparticles. Both positive and negative ion spectra were obtained using a cluster ion source (Bi3 2+ primary ions at 50keV). The positive mode contains an intense C+ signal. The Cn - peaks in the negative ion spectrum show an odd-even effect in their intensities. © 2015 American Vacuum Society. Source

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