Seabrook, MD, United States
Seabrook, MD, United States

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Oldham T.R.,Dell Services Federal Government Inc. | Berg M.,MEI Technologies Inc. | Friendlich M.,MEI Technologies Inc. | Wilcox T.,MEI Technologies Inc. | And 8 more authors.
IEEE Radiation Effects Data Workshop | Year: 2011

A series of heavy ion and laser irradiations was performed to investigate previously reported current spikes in flash memories. High current events were observed, however, none matches the previously reported spikes. Plausible mechanisms are discussed. © 2011 IEEE.


Oldham T.R.,Dell Services Federal Government Inc. | Chen D.,NASA | Friendlich M.,MEI Technologies Inc. | Carts M.A.,NASA | And 2 more authors.
IEEE Transactions on Nuclear Science | Year: 2011

We have compared the data retention of irradiated commercial NAND flash memories with that of unirradiated controls. For parts aged by baking at high temperature, there was a statistically significant difference between irradiated samples and unirradiated controls. For parts aged by repetitive Program/Erase (P/E) cycling, the effect of radiation was not statistically significant. © 2011 IEEE.


Nalli N.R.,Dell Services Federal Government Inc. | Nalli N.R.,National Oceanic and Atmospheric Administration | Joseph E.,Howard University | Morris V.R.,Howard University | And 11 more authors.
Bulletin of the American Meteorological Society | Year: 2011

The US National Oceanic and Atmospheric Administration (NOAA) worked jointly with the Howard University NOAA Center for Atmospheric Sciences (NCAS) to support a series of multidisciplinary, trans-Atlantic Aerosols and Ocean Science Expeditions (AEROSE) onboard the blue-water NOAA ship Ronald H. Brown. The two organizations supported the series of AEROSE onboard the ship to acquire in situ and remotely sensed marine data during intensive observing periods in an effort to address the topics related to the measurement of African dust and smoke phenomena. One of the objectives of the combined effort was to assess the capability of environmental satellite observing systems for detecting and resolving processes of interest pertaining to Saharan and sub-Saharan trans-Atlantic outflows, including the evolution of dust and smoke aerosol distributions during transport.


Wang L.,Dell Services Federal Government Inc. | Goldberg M.,National Oceanic and Atmospheric Administration | Wu X.,National Oceanic and Atmospheric Administration | Cao C.,National Oceanic and Atmospheric Administration | And 3 more authors.
Journal of Geophysical Research: Atmospheres | Year: 2011

Quantifying the radiometric difference and creating a calibration link between Atmospheric Infrared Sounder (AIRS) on Aqua and Infrared Atmospheric Sounding Interferometer (IASI) on MetOp are crucial for creating fundamental climate data records and intercalibrating other narrowband or broadband satellite instruments. This study employs two different methods to assess the AIRS and IASI radiance consistency within the four Geostationary Operational Environmental Satellite (GOES) imager infrared channels (with central wavelengths at 6.7, 10.7, 12.0, and 13.3 μm) through a period of 2 years and 9 months. The first method employs the differences of AIRS and IASI relative to the GOES observations sampled in the tropics to indirectly track the AIRS and IASI radiance differences. The second approach directly compares AIRS and IASI in the polar regions through the simultaneous nadir overpass observations. Both methods reveal that AIRS and IASI radiances are in good agreement with each other both in the tropics and in the polar regions within GOES imager channels used in this study, while AIRS is found to be slightly warmer than IASI by less than 0.1 K. Copyright 2011 by the American Geophysical Union.


Kay M.J.,U.S. Navy | Gadlage M.J.,U.S. Navy | Duncan A.R.,U.S. Navy | Ingalls D.,U.S. Navy | And 2 more authors.
IEEE Transactions on Nuclear Science | Year: 2012

Consecutive write operations performed on a Samsung NAND flash memory are shown to significantly increase the total ionizing dose level at which data corruption occurs. Consequences of multiple consecutive write operations are discussed as well as the mechanisms at work. Elevated temperature exposure and page location within a block of the memory are shown to have significant effects on the amount of data corruption observed. The hardness assurance implications of these effects are discussed. © 1963-2012 IEEE.


Teverovsky A.,Dell Services Federal Government Inc.
IEEE Transactions on Dielectrics and Electrical Insulation | Year: 2012

Breakdown voltages in 27 types of virgin and fractured X7R multilayer ceramic capacitors (MLCC) rated to voltages from 6.3 to 100 V have been measured and analyzed to evaluate the effectiveness of the dielectric withstanding voltage (DWV) testing to screen-out defective parts and get more insight into breakdown specifics of MLCCs with cracks. Fractures in the parts were introduced mechanically and by thermal shock stress. To simulate exposure of internal electrodes to environments in fractured parts, breakdown testing was carried out also on cross-sectioned and polished capacitors. © 1994-2012 IEEE.


Teverovsky A.,Dell Services Federal Government Inc.
46th International Symposium on Microelectronics, IMAPS 2013 | Year: 2013

Multilayer ceramic capacitors (MLCCs) constitute the majority of components used in electronic assemblies and most of their failures are related to cracks. It is often assumed that dissipation factor (DF), insulation resistance (IR), and breakdown voltage (VBR) are characteristics that are sensitive to the presence of mechanical defects, and screening of capacitors by measurements of these characteristics, and by dielectric withstanding voltage (DWV) testing assures high quality products. This work analyzes the effectiveness of these screening techniques for revealing cracks in high-volumetric efficiency, low-voltage ceramic capacitors. Various types of class II dielectric capacitors with rated voltages from 6.3 V to 100 V, and capacitances from 0.1 μF to 100 μF from different manufactures were used in this study. Fractures in the parts were introduced mechanically and by thermal shock stress. It has been shown that cracking results in relatively minor variations of capacitance and DF. Absorption currents prevail over leakage currents during standard IR measurements at room temperatures, and at high temperatures the intrinsic leakage currents exceed substantially leakage currents caused by cracking thus masking the presence of defects. Analysis of distributions of breakdown voltages in normal capacitors and capacitors with cracks showed that the majority of defective capacitors can pass the DWV testing. New, more effective methods of electrical testing and possible improvement of the existing techniques are discussed.


Teverovsky A.,Dell Services Federal Government Inc.
EMPC-2011 - 18th European Microelectronics and Packaging Conference, Proceedings | Year: 2011

Different size X7R MLCCs have been subjected to three types of thermal shock testing: terminal solder pot dip test, ice water test, and liquid nitrogen drop test. Electrical characteristics of the parts were measured through various test conditions to determine critical temperatures that result in fracturing and electrical failures. Optical examinations and cross-sectional analysis were used to confirm the presence of cracks. Mechanisms of fracturing and the effectiveness of different thermal shock methods are discussed. It is shown that the heat conduction and direction of temperature changes (heating or cooling) are critical factors of thermal shock testing of MLCCs. The probability of fracturing depends also on the level of residual mechanical stresses, mostly in terminal areas of ceramic capacitors. © 2011 IMAPS.


Teverovsky A.,Dell Services Federal Government Inc.
IEEE Transactions on Device and Materials Reliability | Year: 2012

The fracturing and failures of multilayer ceramic capacitors (MLCCs) after manual soldering onto printed wiring boards are often associated with a soldering-induced thermal shock that results in substantial mechanical stresses in the parts. Recommendations and guidelines for safe soldering conditions are well developed and documented; however, there is a lack of adequate testing for the selection of MLCCs that are robust enough to sustain stresses related to manual soldering. In this paper, various lots of X7R-type material MLCCs with different size have been subjected to three types of thermal-shock testing: terminal solder-dip test, ice-water test, and liquid-nitrogen drop test. The electrical characteristics of the parts were measured through various test conditions to determine critical temperatures that resulted in fracturing and electrical failures. Optical examinations and cross-sectional analysis were used to confirm the presence of cracks. The mechanisms of fracturing, factors affecting crack formation, and the effectiveness of different thermal-shock methods are discussed. © 2012 IEEE.


Oldham T.R.,Dell Services Federal Government Inc. | Wilcox E.P.,NASA | Friendlich M.R.,NASA
IEEE Radiation Effects Data Workshop | Year: 2013

This study was undertaken to identify and characterize the susceptibilities of the 16 Gbit NAND flash memories from Samsung to destructive and nondestructive single event effects (SEE). © 2013 IEEE.

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