Cypress Semiconductor Corporation is a Silicon Valley-based semiconductor design and manufacturing company founded by T. J. Rodgers and others from Advanced Micro Devices. It was formed in 1982 with backing by Sevin Rosen and went public in 1986. The company initially focused on the design and development of high speed CMOS SRAMs, EEPROMs, PAL devices, and TTL logic devices. Two years after going public the company switched from the NASDAQ to the New York Stock Exchange. In October 2009, the company announced it would switch its listing to the NASDAQ on November 12, 2009. Its headquarters are in San Jose, California, and it has divisions in the United States, Ireland, India and the Philippines as well as a fabrication plant in Minnesota.Some of its main competitors include Microchip Technology, Integrated Device Technology, Samsung Electronics, and Xilinx. Wikipedia.
Maheshwari D.,Cypress Semiconductor
Digest of Technical Papers - IEEE International Solid-State Circuits Conference | Year: 2014
Networking relies on fast line card packet rates that are directly proportional to and limited by the Random Transaction Rate (RTR) of the memory system. Networking line cards to date are ≤200Gb/s and were able to use memories optimized for latency (SRAM) and bandwidth (SDRAM) designed for computing systems. Next generation line cards are ≥400Gb/s and the memory system for these line cards need to be explicitly architected and designed for delivering the required high RTR. © 2014 IEEE.
Cypress Semiconductor | Date: 2016-03-31
A capacitance sensing circuit may include a switching circuit configured to generate a sensor current by charging and discharging a capacitive sensor electrode, and a current mirror that generates a mirror current based on the sensor current. Based on the mirror current, a measurement circuit generates an output signal representative of a capacitance of the capacitive sensor electrode.
Cypress Semiconductor | Date: 2016-09-15
A method of making and structural embodiments of a semiconductor structure are provided. The method includes forming a tunneling layer over a channel connecting a source and a drain formed in a surface of a substrate, forming a charge storage layer overlying the tunneling layer, and forming a blocking structure on the charge storage layer by plasma oxidation. A thickness of the charge storage layer is reduced through oxidation of a portion of the charge storage layer during the formation of the blocking structure. Other embodiments are also described.
Cypress Semiconductor | Date: 2016-09-22
A system comprising a memory controller coupled to a memory device is described. The memory device is coupled to, and is external to, the memory controller. The memory device includes a storage array having dual configurability to support both synchronous and asynchronous modes of operation.
Cypress Semiconductor | Date: 2016-09-20
Systems, methods, and apparatus are disclosed for implementing memory cells having common source lines. The methods may include receiving a first voltage at a first transistor. The first transistor may be coupled to a second transistor and included in a first memory cell. The methods include receiving a second voltage at a third transistor. The third transistor may be coupled to a fourth transistor and included in a second memory cell. The first and second memory cells may be coupled to a common source line. The methods include receiving a third voltage at a gate of the second transistor and a gate of the fourth transistor that may cause them to operate in cutoff mode. The methods may include receiving a fourth voltage at a gate of the first transistor. The fourth voltage may cause a change in a charge storage layer included in the first transistor.
Cypress Semiconductor | Date: 2016-08-30
A non-volatile memory and methods of operating the same to reduce disturbs is provided. In one embodiment, the method includes coupling a first positive high voltage to a first global wordline in a first row of an array of memory cells, and coupling a second negative high voltage (V_(NEG)) to a first bitline in a first column of the array to apply a bias to a non-volatile memory transistor in a selected memory cell to program the selected memory cell. A margin voltage having a magnitude less than VNEG is coupled to a second global wordline in a second row of the array, and an inhibit voltage coupled to a second bitline in a second column of the array to reduce a bias applied to a non-volatile memory transistor in an unselected memory cell to reduce program disturb of data programmed in the unselected memory cell due to programming.
Cypress Semiconductor | Date: 2016-06-13
A semiconductor device includes a substrate comprising a source region and a drain region, a bit storing element formed on the substrate, a memory gate structure, a first insulating layer formed on the substrate, a second insulating layer formed on the substrate, and a select gate structure formed on the first insulating layer. The second insulating layer is formed on the memory gate structure and the select gate structure and between the memory gate structure and the select gate structure.
Cypress Semiconductor | Date: 2016-09-07
A capacitive sensor includes a switching capacitor circuit, a comparator, and a charge dissipation circuit. The switching capacitor circuit reciprocally couples a sensing capacitor in series with a modulation capacitor during a first switching phase and discharges the sensing capacitor during a second switching phase. The comparator is coupled to compare a voltage potential on the modulation capacitor to a reference and to generate a modulation signal in response. The charge dissipation circuit is coupled to the modulation capacitor to selectively discharge the modulation capacitor in response to the modulation signal.
Cypress Semiconductor | Date: 2016-09-07
In fabricating a memory device, a first electrode is provided. An oxide layer is provided on the first electrode. A second electrode is provided on the oxide layer. In a further method of fabricating a memory device, a first electrode is provided. An oxide layer is provided on the first electrode, the oxide layer comprising an oxygen deficiency and/or defects therein. A second electrode is then provided on the oxide layer.
Cypress Semiconductor | Date: 2016-01-05
The present invention provides a semiconductor device that has a shorter distance between the bit lines and easily achieves higher storage capacity and density. The semiconductor device includes: first bit lines formed on a substrate; an insulating layer that is provided between the first bit lines and in a groove in the substrate, and has a higher upper face than the first bit lines; channel layers that are provided on both side faces of the insulating layer, and are coupled to the respective first bit lines; and charge storage layers that are provided on the opposite side faces of the channel layers from the side faces on which the insulating layers are formed.