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Anzelmo J.A.,Corporation Scientifique Claisse | Bouchard M.,Corporation Scinetifique Claisse | Provencher M.-E.,Claisse United States | Provencher M.-E.,International Center for Diffraction Data
Spectroscopy (Santa Monica)

This column installment is the first in a series describing the educational components and processes necessary in learning the technique of X-ray fluorescence (XRF) spectroscopy. Here, we discuss the main areas of training necessary for a good foundation in the analytical methodology of XRF spectroscopy. The installment begins with the place of XRF in the analytical instrumentation spectrum and defines its capabilities and compares them to other elemental analysis techniques. Then a description of a general spectrometer is provided so that the different types and capabilities of the various XRF spectrometers can be listed and understood. This leads to a discussion of the conceptual physics that occurs during XRF analysis, including the physics of the interactions occurring inside the sample that are not related to the spectrometer. Source

Spectris Canada Inc., Corporation Scientifique Claisse Inc. and Fernand Claisse Inc. | Date: 1980-05-27


Corporation Scientifique Claisse Inc. and Fernand Claisse Inc. | Date: 1981-09-22

Machine to Transform Ores, Rocks, Cements and Other Materials into Glass Discs.

Bouchard M.,Corporation Scientifique Claisse | Milliard A.,Corporation Scientifique Claisse | Rivard S.,Corporation Scientifique Claisse | Ness S.,Intertek
Powder Diffraction

A very efficient analytical method using an automated fusion machine as sample preparation tool and a wavelength-dispersive X-ray fluorescence (WDXRF) spectrometer for the determination of all the elements of interest for the iron ore industry has been optimized from the ISO 9516-1 standard method. This updated method allows for the simplification of both laboratory and spectrometry processes and so, in comparison with the original International Organization for Standardization (ISO) method, becomes less restrictive in practice. This method was used to prepare a large variety of iron ores and exploration samples from all over the world. Results of the prevailing XRF application based on pure oxide standards as described in the ISO standard method are compared to the results of a unique XRF calibration application based on certified reference materials (CRMs) for iron ores and iron ores exploration materials. The universal sample preparation fusion method for iron ores and exploration samples developed during the first phase of this project was used to select and evaluate a set of CRMs. Selected throughout the world from well-recognized sources, the chosen set of CRMs allows a wide coverage for all the elements of interest of the iron ore industry, excluding tin oxide. This fusion method allows a matrix match for materials from different origins. A critical evaluation of precision and accuracy has been performed against the ISO standard method. Reference materials not included in the calibration (control samples) was also investigated for accuracy evaluation. Furthermore, comparisons will be made between the data collected from this fusion method implemented in combination with a Bruker S4 Explorer WDXRF Spectrometer, and the analytical requirements of ISO. All deviations from the prevailing standard method parameters (calibration, standards, flux, Fluxer, etc.) will also be pointed out and discussed. © International Centre for Diffraction Data 2014. Source

Baran D.,Friedrich - Alexander - University, Erlangen - Nuremberg | Li N.,Friedrich - Alexander - University, Erlangen - Nuremberg | Breton A.-C.,Laval University | Breton A.-C.,Corporation Scientifique Claisse | And 5 more authors.
Journal of the American Chemical Society

The enormous synthetic efforts on novel solar cell materials require a reliable and fast technique for the rapid screening of novel donor/acceptor combinations in order to quickly and reliably estimate their optimized parameters. Here, we report the applicability of such a versatile and fast evaluation technique for bulk heterojunction (BHJ) organic photovoltaics (OPV) by utilizing a steady-state photoluminescence (PL) method confirmed by electroluminescence (EL) measurements. A strong relation has been observed between the residual singlet emission and the charge transfer state emission in the blend. Using this relation, a figure of merit (FOM) is defined from photoluminescence and also electroluminescence measurements for qualitative analysis and shown to precisely anticipate the optimized blend parameters of bulk heterojunction films. Photoluminescence allows contactless evaluation of the photoactive layer and can be used to predict the optimized conditions for the best polymer-fullerene combination. Most interestingly, the contactless, PL-based FOM method has the potential to be integrated as a fast and reliable inline tool for quality control and material optimization. © 2014 American Chemical Society. Source

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