Entity

Time filter

Source Type

CMM
London, United Kingdom

Home > Press > Bruker Introduces First of Its Kind Dimensional Analysis System: The Novel Contour CMM™ System Fully Integrates 3D Coordinate Measurements with Nanoscale Surface Height, Texture, Waviness and Form Characterization Abstract: At the 30th Control International (www.control-messe.de) trade fair for quality assurance, Bruker (NASDAQ: BRKR) today announced the release of the innovative and unique Contour CMM™ dimensional analysis system, which is the world’s first non-contact metrology system to perform simultaneous nanoscale surface height, texture, waviness and form measurements, as well as 3D coordinate measurements for geometric dimensioning and tolerancing (GD&T), all on one instrument. Leveraging decades of world-leading optical metrology innovation, the system performs rapid, non-contact precision measurements to meet the industry’s most stringent standards. The Contour CMM system enables more accurate and convenient metrology for R&D and manufacturing of small structures in precision-machined components across a wide range of industries, from medical devices and optics, to automotive and aerospace. “Contour CMM is an exciting breakthrough in the marriage of high-resolution optical surface profiling and coordinate measurement,” said Donald K. Cohen, Ph.D., Managing Member at Michigan Metrology, LLC. “It will allow engineers and researchers to examine parts in a completely new way and develop data that has previously been impossible to generate. Designers and manufacturers of precision components will gain significant value from having this capability to accelerate development and increase the quality of their products.” “The Contour CMM system is a new enabler that fills a technology gap that industry has desired to bridge for many years,” added James Earle, Vice President and General Manager of Bruker’s Tribology, Stylus and Optical Metrology Business. “Our customers have had to face the uncertainties that come from fusing data from multiple technologies to solve manufacturing problems or investigate materials. Now they can get all the detailed surface metrology they have come to rely upon from our systems, and also locate that data within the larger form for true, one-stop characterization.” About the Contour CMM Dimensional Analysis System Contour CMM transcends the boundaries of surface and coordinate characterization, quantifying a metrology continuum from surface roughness and texture through waviness into true 3D coordinate measurements of geometric dimensions with tolerancing analysis. The instrument exploits Bruker’s industry-leading Wyko® interferometric optical profiling technology in a proprietary optical probe. This generates extremely high vertical (2-nanometer) and lateral (0.9 micron) resolution surface finish data. High accuracy stages enable utilization of this surface data as building blocks for a true part coordinate system with form error less than 2 microns. Its Vision Dimensions™ software offers proprietary features specifically designed for small-part characterization, including automation for part programs, hundreds of preset analyses, and customized inspection reports. For advanced R&D, such as the measurement of material wear on medical implants or bearing races, the Contour CMM system provides, in a single instrument, the ability to quantify the smallest of wear scars with submicron accuracy, while enabling engineers to position where the scars are on the parts and report the deviation of the inspected part from CAD. About Bruker Nano Surfaces Division For more than 50 years, Bruker has enabled scientists to make breakthrough discoveries and develop new applications that improve the quality of human life. Bruker’s high-performance, scientific research instruments and high-value analytical solutions enable scientists to explore life and materials at molecular, cellular and microscopic levels. In close cooperation with our customers, Bruker is enabling innovation, productivity and customer success in life science molecular research, in applied and pharma applications, in microscopy, nano-analysis and industrial applications, as well as in cell biology, preclinical imaging, clinical research, microbiology and molecular diagnostics. For more information, please click If you have a comment, please us. Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.


Reverdin G.,University Pierre and Marie Curie | Boutin J.,University Pierre and Marie Curie | Martin N.,University Pierre and Marie Curie | Lourenco A.,University Pierre and Marie Curie | And 7 more authors.
Journal of Atmospheric and Oceanic Technology | Year: 2010

The accuracy of temperature measurements from drifters is first examined for 16 drifters (manufactured either by Metocean Data Systems or by Pacific Gyre) deployed with two temperature sensors in the tropical or North Atlantic Ocean. One of these sensors is the SST thermistor commonly used on Surface Velocity Program (SVP) drifters since the late 1980s; whereas the other sensor is a platinum temperature probe associated with a Seabird conductivity cell. The authors find (for 19 separate deployments) an average positive offset of the SST thermistor measurements in 17 out of 19 cases, exceeding 0.1°C in five instances. Among the five drifters that were at sea for a year ormore, two present a large trend in this offset (0.10° and -0.10°C yr-1); and in two other cases, there is a clear annual cycle of the offset, suggesting a dependency on temperature. Offsets in 9 out of 12 drifters with sea time longer than 4 months present a negative trend, but the average trend is not significantly different from zero. The study also examined 29 drifters from four manufacturers equipped only with the usual SST thermistor, but for which either a precise initial temperature measurement was available or a float was attached to provide accurate temperature measurements (for a duration on the order of a month). These comparisons often identify SST biases at or soon after deployment. This initial bias is null (or slightly negative) for the set of Clearwater Instrumentation's drifters, it is very small for two out of three sets of Technocean drifters, and positive for the third one, as well as for the set of Pacific Gyre drifters (on the order of 0.05°C). © 2010 American Meteorological Society. Source


Reverdin G.,University Pierre and Marie Curie | Morisset S.,University Pierre and Marie Curie | Bellenger H.,University Pierre and Marie Curie | Boutin J.,University Pierre and Marie Curie | And 6 more authors.
Journal of Atmospheric and Oceanic Technology | Year: 2013

This study describes how the hull temperature (Ttop) measurements from multisensor surface velocity program(SVP) drifters can be combined with other measurements to provide quantitative information on nearsurface vertical temperature stratification during large daily cycles. First, Ttop is compared to the temperature measured at 17-cm depth from a float tethered to the SVP drifter. These 2007-12 SVP drifters present a larger daily cycle by 1%-3%for 1°-2°Cdaily cycle amplitudes, with amaximumdifference close to the local noon. The difference could result from flow around the SVP drifter in the presence of temperature stratification in the top 20 cm of the water column but also from a small influence of internal drifter temperature on Ttop. The largest differences were found for small drifters (Technocean) for very large daily cycles, as expected from their shallower measurements. The vertical stratification is estimated by comparing these hull data with the deeper T or conductivity Cmeasurements from Sea-Bird sensors 25 (PacificGyre) to 45 cm(MetOcean) below the top temperature sensor. The largest stratification is usually found near local noon and early afternoon. For a daily cycle amplitude of 18C, these differences with the upper level are in the range of 3%-5%of the daily cycle for the PacificGyre drifters and 6%-10%forMetOcean drifters with the largest values occurring when themidday sun elevation is lowest. The relative differences increase for larger daily cycles, and the vertical profiles become less linear. These estimated stratifications are well above the uncertainty on Ttop. © 2013 American Meteorological Society. Source


Reverdin G.,University Pierre and Marie Curie | Marie L.,French Research Institute for Exploitation of the Sea | Lazure P.,French Research Institute for Exploitation of the Sea | d'Ovidio F.,University Pierre and Marie Curie | And 18 more authors.
Journal of Marine Systems | Year: 2013

In April-November 2009, surface salinity data provide a good coverage of most of the south-east Bay of Biscay and nearby Aquitaine/Armorican shelves. By late April most of the shelf, in particular south of 46°N, is covered by a fresh surface layer amounting to a fresh water volume of 49·109m3. At that time, a moderate amount of fresh water has spread over the Landes Plateau. By mid-June, this shelf water penetrates over the Cape Ferret Canyon north of the Landes Plateau. By mid-July, it is found west of the Landes Plateau to at least 4°W, with an estimated fresh-water content of 11-14·109m3. Drifters deployed on June 17 in the Cape Ferret Canyon, or later on the shelves, confirm the spreading of shelf fresh-water over the deep ocean. Lagrangian tracking using altimetric products, also confirms the transport by a quasi-stationary circulation. Operational numerical simulations (PREVIMER, IBI, HYCOM) display this spread of the freshwater, but in different areas. In particular, all have some fresh water escaping westward near the coast in the Basque region, which is not observed. Later in the summer season, the fresh water spreads westward to south-westward and along the shelf break to at least 5.5°W in late September. © 2011 Elsevier B.V. Source


News Article
Site: http://phys.org/technology-news/

This advice comes from the Manufacturing Metrology Team at The University of Nottingham which has designed and developed an in-situ snow cleaning method specifically for CMM styli after finding general cleaning solutions available on the market today were unfit for purpose. A CMM is a mechanical system that measures the dimensions of a manufactured object, using a stylus that makes contact with its surface at various intervals to plot and record coordinates. CMMs are increasingly used to verify the complex geometry of micro-scale components in the automotive, medical and telecommunications industries. Measurement error can occur if the highly-sensitive stylus tip, contaminated with tiny debris particles, touches a surface. This can lead to errors that are 10 times greater than the standard error margin expected of the instrument. In the face of a lack of industry-wide solution, Dr Xiaobing Feng, Dr Simon Lawes and Dr Peter Kinnell (now at Loughborough University) from the Manufacturing Metrology Team in the Department of Mechanical Engineering at The University of Nottingham began investigating the problem in 2014. After testing various cleaning systems, they determined that using a high velocity stream of CO2 gas and small dry ice particles, a technique known as snow cleaning, is the best method. The dry ice strikes and cleans the surface, clearing particles and thin layers of organic residue as effectively as solvents, but with the advantage of no chemical reactions or abrasive processes. Dr Xiaobing Feng explains: "Solid dry ice particles possess greater momentum than air to dislodge and remove any size particles of debris from micro components in precision measuring equipment. "Snow cleaning is effective and gentle so it doesn't damage the very fragile stylus - which may cost up to around £800 each - and are easily broken. It is also an eco-neutral technique as the CO2 is extracted from air." The researchers developed the novel technique specifically for on-machine cleaning. As the stylus does not rotate, they used three nozzles, with identical geometry, symmetrically positioned, to clean the entire stylus tip and balance the impact force. The technique also uses short pulses of stream to alleviate a 'snow' build-up on the tip surface, which can obstruct further cleaning. "A particle just a few micrometres in size can cause significant dimensional measurement errors. Therefore, regular cleaning of the stylus tip is critical in maintaining accuracy and extending life expectancy. As any sacrifice on speed is worth taking as measurements are redundant if inaccurate," adds Dr Feng. To complement the snow cleaning prototype, the researchers are now working on developing a stylus contamination inspection system for in-line quality control of µCMM measurements. Their next steps are to investigate and monitor how quickly probes get dirty and how often they need cleaning in different environments.

Discover hidden collaborations