Center for Ceramics Processing

ARCI, India

Center for Ceramics Processing

ARCI, India
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Naidu V.A.,University of Hyderabad | Reddy V.R.,University of Hyderabad | Rao R.S.,BDL | Suresh M.B.,Center for Ceramics Processing | And 2 more authors.
Materials Today: Proceedings | Year: 2015

In this study, preparation of different designs of thin films by physical vapour deposition (PVD) with the help of MgF2 and YF3 materials of low and medium refractive index on the BK-7 glass substrate at Near Infra Region (NIR) with quarter wave thickness of 963nm (0.9 um) is presented. The structural and optical properties of MgF2/YF3 thin films produced by PVD technique have been investigated. Transmission is found to vary continuously with layer thickness. The optical transmittance at normal incidence was obtained in the wavelength range 500-2000nm by using UV/VIS/NIR spectrophotometer. The crystalline nature and orientation of the MgF2/YF3 thin films have been systematically investigated at room temperature by X-ray diffraction patterns (XRD). The surface morphology studies of Roughness (Ra), RMS, Grain size were investigated systematically by Atomic Force Microscope (AFM). © 2015.

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