Gao F.,Cavendish Laboratory J J Thomson Avenue |
Wang J.,Cavendish Laboratory J J Thomson Avenue |
Blakesley J.C.,University of Potsdam |
Hwang I.,Cavendish Laboratory J J Thomson Avenue |
And 2 more authors.
Advanced Energy Materials | Year: 2012
Drift-diffusion modeling is used to quantify different loss mechanisms in polymer:fullerene photovoltaic devices. Based on the modeling, which takes into account the carrier-density dependence of the mobility, the relative importance of geminate recombination, bimolecular recombination, and the space-charge effect are able to be quantified under different conditions. © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.