Madison, WI, United States
Madison, WI, United States

Bruker Corporation is a manufacturer of scientific instruments for molecular and materials research, as well as for industrial and applied analysis. It is headquartered in Billerica, Massachusetts and is the publicly traded parent company of Bruker Scientific Instruments and Bruker Energy & Supercon Technologies divisions.In April 2010, Bruker created a Chemical Analysis Division under the Bruker Daltonics subsidiary. This division contains three former Varian product lines: ICPMS systems, laboratory gas chromatography , and GC-triple quadrupole mass spectrometer .In 2012 it sponsored the Fritz Feigl Prize. Wikipedia.

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Bruker and Anderson Forschung Group LLC | Date: 2017-01-27

A method for determining the concentration ratio in a sample of a target peptide to a reference peptide that is chemically identical with the target peptide, but labeled by isotopes, acquires mass spectra of the target and reference peptides. One of a plurality of families of superimposed bell-shaped curves which is a best fit to ion current peak groups of the target and reference peptides in the mass spectra is determined by varying parameters of the families. In each family, each bell-shaped curve has a predetermined height, the curves have fixed distances from each other and the relative curve heights and curve distances in the families are individually calculated from an elemental composition of the peptides and an isotope abundance distribution of elements composing the peptides, taking into account purity of the isotopes. The concentration ratio is then determined from the parameters of the best fit.

A method for X-ray detection using a charge-integrating X-ray detector (10) including a photodetector array (12) of pixels (14), each of which converts incident radiation into accumulated charge during an X-ray exposure, is provided. The method includes, for each pixel, reading out the accumulated charge from the pixel and determining an X-ray charge value from the read out accumulated charge. If the X- ray charge value is less than a photon counting threshold, the X-ray charge value is replaced with a quantized charge value representative of an estimated photon count and recording the quantized charge value as a recorded charge value. If, however, the X-ray charge is equal to or greater than the photon counting threshold, the X-charge value is recorded as the recorded charge value. The method allows operating a charge-integrating X-ray detector in a mixed photon- counting/analog output mode.

A method for performing an X-ray diffraction analysis of a crystal sample (112) using a two-dimensional detector (114) that integrates an X-ray diffraction signal while the position of the sample (112) relative to an X-ray source (102) is changed along a scan direction, such as a rocking scanning curve. The resulting image is compressed along the scan direction, but may be collected very quickly. The capture of both on-axis and off-axis reflections in a single image provides a common spatial frame of reference for comparing the reflections. This may be used in the construction of a reciprocal space map, and is useful for analyzing a sample with multiple crystal layers, such as a crystal substrate with a crystalline film deposited thereupon.

An X-ray diffraction system uses a two-dimensional detector to detect diffracted X-ray energy at a plurality of radial positions surrounding a sample location, the results at each position being combined to form a final diffraction image. To minimize smearing in the final image, the detector pixel intensities at each position are reapportioned among the pixel locations prior to being combined with the intensities collected at other positions. A two-dimensional pixel array space of the detector is projected onto a cylinder to form a projected pixel array space, and a virtual cylindrical detection surface representative of an ideal cylindrical detector is determined. An overlap between the pixels of the projected pixel array space and the pixels of the virtual cylindrical detection surface is determined, and pixel intensities are reapportioned accordingly. The reapportionment may include dividing each pixel space into subpixels and redistributing the subpixels among adjacent pixels.

The invention relates to a method for identifying crystalline phases in a polycrystalline sample, comprising the method steps: a) for each crystal structure that is suspected in the sample, determining a normalized vector p(i) for the chemical composition of the crystal structure, wherein the basis of the vector represents elements and/or compounds and thus the coordinates of the vector comprise details about the concentration of the elements and/or compounds inside the crystal structure; b) at each measurement point of the sample, (i) recording of a spectrum by means of energy-dispersive X-ray spectroscopy (EDX spectrum) and determining of the chemical composition and (ii) recording of an electron diffraction image and determining of the diffraction bands; c) determining of a normalized vector v for the chemical composition at the measurement point, the coordinates whereof comprise details about the concentration of the elements and/or compounds at the measurement point; d) comparison of the normalized vector v for the chemical composition at the measurement point with each of the normalized vectors p(i) of the suspected crystal structures by issuing an evaluation factor s(i) for correlating each vector; e) comparison of the diffraction bands determined at the measurement point with the diffraction bands of the suspected crystal structures by issuing an evaluation factor n(i) for correlating the diffraction bands; and f) determining an overall quality from the two evaluation factors s(i) and n(i) and attributing the crystal structure with the highest overall quality to the measurement point.

method for acquiring fragment ion spectra of substances in complex substance mixtures wherein a trapped ion mobility spectrometer (TIMS) is used as the ion mobility separator separation device. The fragment ion spectra may be used for the identification of high numbers of proteins in complex mixtures, or for a safe quantification of some substances, by their fragment ion mass spectra in a mass spectrometer with up-front substance separator. TIMS with parallel accumulation provides the unique possibility to prolong the ion accumulation duration to find more detectable ion species without decreasing the measuring capacity for fragment ion mass spectra. The high measurement capacity for fragment ion mass spectra permits the repeated measurement of low abundance ion species to improve the quality of the fragment ion spectra.

The invention relates to a method (90) for scanning a sample (99) by means of x-ray optics (100) for irradiating the sample (99) with x-rays (107a), comprising the following steps: (a) displacing a measuring point (106), defined by an optical initial point (108) of the x-ray optics (100), in the sample (99) in a first scanning direction (92) by means of swiveling the x-ray optics (100) about a first swivel axis (336); (b) detecting radiation (107b) emanating from the sample (99) at at least two measuring points (106) along the first scanning direction (92); (c) combining measured values correlating with the detected radiation (107b) to form an overall scan. Moreover, the invention relates to an apparatus (96) for scanning a sample (99), comprising: x-ray optics (100) for irradiating a sample (99) with x-rays (107a); a goniometer mechanism (300) connected to the x-ray optics (100), wherein the goniometer mechanism (300) is configured to carry out a swiveling of the x-ray optics (100) about a first swivel axis (336); at least one actuator (117) which is embodied to actuate the goniometer mechanism (300); and a control device (97) which is embodied to carry out the method as claimed in one of the preceding claims.

Operation of ion mobility spectrometers based on gases pushing the ions over electrical field barriers, preferably in combination with mass spectrometers, and relates to trapped ion mobility spectrometers (TIMS). The ions of a selected range of mobilities are accumulated and scanned by using a long and flat electric field ramp created by additional voltages. By a voltage supplied at the beginning of the flat ramp, the lowest mobility of the mobility range of ions to be collected can be selected. By the difference of the voltages at the beginning and the end, the width of the mobility range is determined. The spatial zoom advantageously can collect considerable more ions of interest than a temporal zoom without severe losses by space charge effects, and more ions can be detected in the mass-mobility map.

The invention relates to a low-cost spring steel plate as the sample support on a dimensionally stable and precisely shaped substructure, machined from an aluminum alloy, for example, and using a pattern of embedded magnets so that said plate is removable and that a body is created overall which is suitable for use in robots, for example by giving it the dimensions of a conventional microtitration plate. The planarity of the surface onto which the (organic) samples are applied is provided within the near region by the spring steel plate itself and in the far region over the whole spring steel plate by the substructure. The spring steel plate may be designed for single use in order to satisfy IVD diagnostic regulations also, for example. It can be equipped with identification codes, sample site markings and pre-coatings for different types of analytical tasks, such as MALDI-TOF mass spectrometric analysis.

Agency: European Commission | Branch: H2020 | Program: ECSEL-IA | Phase: ECSEL-15-2015 | Award Amount: 150.05M | Year: 2016

The TAKE5 project is the next in a chain of thematically connected ENIAC JU KET pilot line projects which are associated with 450mm/300mm development for the 10nm technology node and the ECSEL JU project SeNaTe aiming at the 7nm technology node. The main objective of the TAKE5 project is the demonstration of 5nm patterning in line with the industry needs and the ITRS roadmap in the Advanced Patterning Center at the imec pilot line using innovative design and technology co-optimization, layout and device architecture exploration, and comprising demonstration of a lithographic platform for EUV technology, advanced process and holistic metrology platforms and new materials. A lithography scanner will be developed based on EUV technology to achieve the 5nm module patterning specification. Metrology platforms need to be qualified for 5nm patterning of 1D, 2D and 3D geometries with the appropriate precision and accuracy. For the 5nm technology modules new materials will need to be introduced. Introduction of these new materials brings challenges for all involved deposition processes and the related equipment set. Next to new deposition processes also the interaction of the involved materials with subsequent etch steps will be studied. The project will be dedicated to find the best options for patterning. The project relates to the ECSEL work program topic Process technologies More Moore. It addresses and targets as set out in the MASP at the discovery of new Semiconductor Process, Equipment and Materials solutions for advanced CMOS processes that enable the nano-structuring of electronic devices with 5nm resolution in high-volume manufacturing and fast prototyping. The project touches the core of the continuation of Moores law which has celebrated its 50th anniversary and covers all aspects of 5nm patterning development.

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