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Yanggu, South Korea

Ahn H.,Kyonggi University | Park M.,BISTel Inc | Kim K.P.,Kyonggi University
International Conference on Advanced Communication Technology, ICACT | Year: 2014

In this paper, we propose a formal description for representing the scientific workflow model supporting process-driven scientific behaviors in data intensive experiment procedures and large scale computing environments. We try to make a conceptual extension of the information control net methodology so as to be applicable to the scientific workflow models and systems, and dub it scICN (Scientific Information Control Net). Upon the SClCN-based scientific workflow model, we exemplify its application to a pseudo SClCN-based scientific workflow model. © 2014 Global IT Research Institute (GIRI). Source


Kim M.-J.,Yonsei University | Ahn H.,Kyonggi University | Park M.-J.,BISTel Inc
KSII Transactions on Internet and Information Systems | Year: 2015

In this paper, we build a theoretical framework for quantitatively measuring and graphically representing the degrees of closeness centralization among performers assigned to enact a workflow procedure. The degree of closeness centralization of a workflow-performer reflects how near the performer is to the other performers in enacting a corresponding workflow model designed for workflow-supported organizational operations. The proposed framework comprises three procedural phases and four functional transformations, such as discovery, analysis, and quantitation phases, which carry out ICN-to-WsoN, WsoN-to-SocioMatrix, SocioMatrix-to-DistanceMatrix, and DistanceMatrix-to-CCV transformations. We develop a series of algorithmic formalisms for the procedural phases and their transformative functionalities, and verify the proposed framework through an operational example. Finally, we expatiate on the functional expansion of the closeness centralization formulas so as for the theoretical framework to handle a group of workflow procedures (or a workflow package) with organization-wide workflow-performers. © 2015 KSII. Source


Kim M.-J.,Yonsei University | Ahn H.,Kyonggi University | Park M.,BISTel Inc
KSII Transactions on Internet and Information Systems | Year: 2015

A hot-issued research topic in the workflow intelligence arena is the emerging topic of “workflow-supported organizational social networks.” These specialized social networks have been proposed to primarily represent the process-driven work-sharing and work-collaborating relationships among the workflow-performers fulfilling a series of workflow-related operations in a workflow-supported organization. We can discover those organizational social networks, and visualize its analysis results as organizational knowledge. In this paper, we are particularly interested in how to visualize the degrees of closeness centralities among workflow-performers by proposing a graphical representation schema based on the Graph Markup Language, which is named to ccWSSN-GraphML. Additionally, we expatiate on the functional expansion of the closeness centralization formulas so as for the visualization framework to handle a group of workflow procedures (or a workflow package) with organizational workflow-performers. © 2015 KSII. Source


Ko H.-H.,Korea University | Kim J.-S.,BISTel Inc | Kim J.,Kwangwoon University | Baek J.-G.,Korea University | Kim S.-S.,Korea University
Expert Systems with Applications | Year: 2011

This paper proposes an efficient control method to minimize process error and to reduce process variance in semiconductor manufacturing. The photolithography (photo) process forms a complex semiconductor circuit and is important for quality. Obstacles to the process include the facility itself, vibration, wear and tear, product/process changes and environmental influences. Control methodologies being currently used to address these issues often amplify the variation of the process by failing to perform adequate process control. Therefore, this paper proposes an effective process control method to reduce process variance by quickly detecting and identifying process disturbances and accurately reflecting the degree of change to process control. This study proposes dynamic deadband control that uses a region (band) to detect the status of a process change. It adjusts the process control based on the changes detected. In this research, the semiconductor manufacturing company is supported to perform control that is more precise and reduces fluctuations by producing products of uniform quality. In addition, it can contribute to yield due to the quality incentive and increased process control of semiconductor manufacturing. © 2010 Elsevier Ltd. All rights reserved. Source


Ma J.,Korea Institute of Science and Technology | Lee J.-S.R.,Korea Institute of Science and Technology | Cho K.,Korea Institute of Science and Technology | Park M.,BISTel Inc
International Conference on Advanced Communication Technology, ICACT | Year: 2016

Nowadays, the importance of big data processing has been mentioned. So, we propose a data analysis system for big data processing. The proposed system is considered the processing of GPDB and HDFS, and also supports the processing of files, and a relational database. This paper describes a conceptual analysis of the big data processing system, and provides the processed data and display the results. © 2016 Global IT Research Institute (GiRI). Source

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