BISTel Inc

Seocho gu, South Korea

BISTel Inc

Seocho gu, South Korea

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Ahn H.,Kyonggi University | Park M.,BISTel Inc. | Kim K.P.,Kyonggi University
International Conference on Advanced Communication Technology, ICACT | Year: 2014

In this paper, we propose a formal description for representing the scientific workflow model supporting process-driven scientific behaviors in data intensive experiment procedures and large scale computing environments. We try to make a conceptual extension of the information control net methodology so as to be applicable to the scientific workflow models and systems, and dub it scICN (Scientific Information Control Net). Upon the SClCN-based scientific workflow model, we exemplify its application to a pseudo SClCN-based scientific workflow model. © 2014 Global IT Research Institute (GIRI).


Park M.,BISTel Inc | Kim K.P.,Kyonggi University
ICIC Express Letters | Year: 2014

Generally, the current available workflow enactment event formats are based upon the so-called activity-centered runtime state model, and so they are appropriately designed for supporting the control-flow oriented workflow-intelligence mining techniques. However, it is not sufficient to grasp the information like workflow-supported social networks and workflow-supported affiliation networks from the event logs. Therefore, we need to create a model for performer-centered runtime state. In addition, the format of the data is needed. So, this paper tries to devise a new runtime state model and its related event log format so as to generate workflow performer-centered event logs, and we dub it the workflow performer-centered runtime state model, which is able to efficiently support the relation-oriented workflow-intelligence mining techniques. © 2014 ISSN 1881-803X.


Park M.,BISTel Inc. | Ahn H.,Kyonggi University | Kim K.P.,Kyonggi University
International Conference on Advanced Communication Technology, ICACT | Year: 2014

In this paper, we propose an algorithmic approach for analyzing (control-flow and data-flow driven) dominancies among scientific activities in a scientific workflow model supported by data intensive experiment procedures and large scale computing environments. Upon the SClCN-based scientific workflow model, we explicate the proposed approach from devising an activity dominancy analysis algorithm to exemplifying its application to a pseudo SClCN-based scientific workflow model, and finally define the activity dominancy net to represent the output of the algorithm formally and graphically. We expect that the analyzed activity dominancies ought to be helpful not only in the design of load balancing mechanisms for large scale distributed workflow systems, but also in the implementation of exception-handling and recovery mechanisms for concretizing data intensive and flexible scientific workflow systems. © 2014 Global IT Research Institute (GIRI).


Kim M.-J.,Yonsei University | Ahn H.,Kyonggi University | Park M.-J.,BISTel INC
KSII Transactions on Internet and Information Systems | Year: 2015

In this paper, we build a theoretical framework for quantitatively measuring and graphically representing the degrees of closeness centralization among performers assigned to enact a workflow procedure. The degree of closeness centralization of a workflow-performer reflects how near the performer is to the other performers in enacting a corresponding workflow model designed for workflow-supported organizational operations. The proposed framework comprises three procedural phases and four functional transformations, such as discovery, analysis, and quantitation phases, which carry out ICN-to-WsoN, WsoN-to-SocioMatrix, SocioMatrix-to-DistanceMatrix, and DistanceMatrix-to-CCV transformations. We develop a series of algorithmic formalisms for the procedural phases and their transformative functionalities, and verify the proposed framework through an operational example. Finally, we expatiate on the functional expansion of the closeness centralization formulas so as for the theoretical framework to handle a group of workflow procedures (or a workflow package) with organization-wide workflow-performers. © 2015 KSII.


Kim M.-J.,Yonsei University | Ahn H.,Kyonggi University | Park M.,BISTel INC
KSII Transactions on Internet and Information Systems | Year: 2015

A hot-issued research topic in the workflow intelligence arena is the emerging topic of “workflow-supported organizational social networks.” These specialized social networks have been proposed to primarily represent the process-driven work-sharing and work-collaborating relationships among the workflow-performers fulfilling a series of workflow-related operations in a workflow-supported organization. We can discover those organizational social networks, and visualize its analysis results as organizational knowledge. In this paper, we are particularly interested in how to visualize the degrees of closeness centralities among workflow-performers by proposing a graphical representation schema based on the Graph Markup Language, which is named to ccWSSN-GraphML. Additionally, we expatiate on the functional expansion of the closeness centralization formulas so as for the visualization framework to handle a group of workflow procedures (or a workflow package) with organizational workflow-performers. © 2015 KSII.


Ma J.,Korea Institute of Science and Technology | Lee J.-S.R.,Korea Institute of Science and Technology | Cho K.,Korea Institute of Science and Technology | Park M.,BISTel Inc.
International Conference on Advanced Communication Technology, ICACT | Year: 2016

Nowadays, the importance of big data processing has been mentioned. So, we propose a data analysis system for big data processing. The proposed system is considered the processing of GPDB and HDFS, and also supports the processing of files, and a relational database. This paper describes a conceptual analysis of the big data processing system, and provides the processed data and display the results. © 2016 Global IT Research Institute (GiRI).


Ahn H.,Kyonggi University | Park M.,BISTel Inc. | Kim H.,University of Suwon | Kim K.P.,Kyonggi University
International Conference on Advanced Communication Technology, ICACT | Year: 2015

The purpose of this paper is to implement the theoretical closeness centrality measurement algorithm [1] that was proposed by the authors' research group in order to numerically analyze closeness centrality measures among workflow-performers on a workflow-supported social network model. We implement the essential part of the proposed algorithm[l], which is a closeness centrality analysis equation. Finally, we illustrate the implemented algorithm by showing its run-time screen-shots with an operational example. © 2015 Global IT Research Institute (GiRI).


Ko H.-H.,Korea University | Kim J.-S.,BISTel INC | Kim J.,Kwangwoon University | Baek J.-G.,Korea University | Kim S.-S.,Korea University
Expert Systems with Applications | Year: 2011

This paper proposes an efficient control method to minimize process error and to reduce process variance in semiconductor manufacturing. The photolithography (photo) process forms a complex semiconductor circuit and is important for quality. Obstacles to the process include the facility itself, vibration, wear and tear, product/process changes and environmental influences. Control methodologies being currently used to address these issues often amplify the variation of the process by failing to perform adequate process control. Therefore, this paper proposes an effective process control method to reduce process variance by quickly detecting and identifying process disturbances and accurately reflecting the degree of change to process control. This study proposes dynamic deadband control that uses a region (band) to detect the status of a process change. It adjusts the process control based on the changes detected. In this research, the semiconductor manufacturing company is supported to perform control that is more precise and reduces fluctuations by producing products of uniform quality. In addition, it can contribute to yield due to the quality incentive and increased process control of semiconductor manufacturing. © 2010 Elsevier Ltd. All rights reserved.


Ahn H.,Kyonggi University | Park M.,BISTel Inc. | Kim K.P.,Kyonggi University
CEUR Workshop Proceedings | Year: 2013

In this demo-paper, we implement a workflow-supported organizational intelligence system, which is named as wOIS-paan. The major functionality of the current version of the system is to explore "work- flow performer-activity affiliation networking knowledge" from an XPDL- based workflow model, and to visualize the knowledge in a graphical form of the force-directed-layout of the Prefuse toolkit. The implemented sys- Tem operates under a series of algorithms discovering, analyzing, measuring, and visualizing workflow performer-activity affiliation networking knowledge from an XPDL-based workflow package3, which represents involvement and participation relationships, after all, between a group of performers and a group of activities. The eventual goal of the system is to measure and visualize the human resource allotments and contributions in enacting a workflow procedure (or a group of workflow procedures) at a glance. Also, in terms of the scalability of the system, it can be extensible to show the organization-wide workflow procedures. Conclusively, the wOIS-paan system ought to be a very valuable tool for the BPM and workflow design and operational performance analyzers and consultants.


A method of detecting a fault in a semiconductor manufacturing process. The method includes obtaining measured data and reference data regarding at least one parameter related to semiconductor manufacturing conditions in a process included in a semiconductor manufacturing process during a pre-set period of time; converting the measured data and the reference data by using at least one principal component parameter obtained via principal component analysis with respect to the measured data and the reference data; calculating a similarity between the converted measured data and the converted reference data; and detecting a fault in the process based on the calculated similarity. As a result, production efficiency of a semiconductor manufacturing process may be improved.

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