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Wang Q.-Y.,Beijing San Talking Testing Engineering Academy Co | Liu Y.-F.,Beijing San Talking Testing Engineering Academy Co | Chen Y.,Beijing San Talking Testing Engineering Academy Co | Jiang D.-Y.,Beijing San Talking Testing Engineering Academy Co | Bai H.,Beijing San Talking Testing Engineering Academy Co
Hedianzixue Yu Tance Jishu/Nuclear Electronics and Detection Technology | Year: 2010

The paper points out that there are differences in dose rate between the ESA/SCC 22900 and the MIL-STD-883G TM 1019.7. The total dose and relevant dose rate of TED test reports from NASA are analysed. Step radiation method is used to different technical devices. The dose rate is nearly all less than 1rad(Si)/s and is changed by the total dose. When the total dose is less than 30krad(Si), the curve distribution of the dose rate is randomness, which exhibits no regularity between total dose and dose rate. When the total dose is greater than 30krad(Si), the dose rate increases by the total dose, but it dose not linear relation. The reason of the failure is interface state at low dose rate radiation and oxide trap charge at high dose rate radiation.

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