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Kong L.,Beijing Institute of Technology | Zhao Y.,Beijing Institute of Technology | Yu F.,Beijing Space Mechanical and Electrical Research Institute | Dong L.,Beijing Institute of Technology | Li B.,Beijing Institute of Technology
Proceedings of SPIE - The International Society for Optical Engineering | Year: 2012

A method for capturing the solar shape and location on occurrence of solar occultation is presented. On occurrence of occultation when the Sun is covered by atmosphere, the solar shape viewed by satellite-borne detector on certain orbit through atmosphere at different heights varies greatly due to such factor as the in homogeneity of atmosphere and cloud covering, etc. During the varying of heights of atmosphere, the gray image of Sun also changes, which even appears several parts in different size due to the disturbance of cloud layer. Based on which, the Paper proposes a method for capturing solar shape and intensity on occurrence of solar occultation. First, taking the solar grey image without atmospheric refraction effects as a reference; then the refraction angle of Sun ray after being refracted by atmosphere can be reversely calculated by using Abel integral function and the vertically distributed data of index of refraction; Last, the solar shape after passing atmosphere can be obtained by calculating the refraction angle of the ray on solar limb. We have obtained the image of solar shape and intensity at the occultation central point of contact from 5km to 60km when the detector is located at the defined satellite orbit (600km) by simulation. This method is of great significance for realizing the solar simulator which can reflect solar shape and intensity in a comparatively truly degree under the circumstance of existing various affecting factors for application in the fields like measuring and calibration of posture parts of satellite, remote sensing technology and material measure, etc. © 2012 SPIE.

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