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Ley A.,ASSET InterTech Inc.
SMT Surface Mount Technology Magazine | Year: 2013

Although intrusive test technologies on the manufacturing floor such as ICT have been effective in the past, recent advancements in basic electronic technologies are disrupting legacy test methods. Now, non-intrusive board testing is replacing the intrusive types, such as in-circuit testing. Source

Woppman G.,ASSET InterTech Inc.
EE: Evaluation Engineering | Year: 2010

Glenn Woppman, ASSET InterTech, suggests that corporate culture is the set of overriding beliefs, attitudes, work ethic, and values that are shared by a majority of the people in an organization and which characterize the nature of the group. It is a significant factor in determining the success or failure of the company and that starts at the top management level. Every leader needs to include it in his or her strategic planning process alongside product roadmaps, timelines, management-by-objectives and all other documents that are essential for planning for the future. A company's culture can be a critical part of the organization's core competency in a high-tech industry, as many companies are unable to compete as much on the basis of factories and capital investments as they do on brain power, innovation, creativity, and ideas. Source

Dworak J.,Southern Methodist University | Crouch A.,ASSET InterTech Inc.
Proceedings of the IEEE VLSI Test Symposium | Year: 2015

Today's chips often contain a wealth of embedded instruments, including sensors, hardware monitors, built-in self-test (BIST) engines, etc. They may process sensitive data that requires encryption or obfuscation and may contain encryption keys and ChipIDs. Unfortunately, unauthorized access to internal registers or instruments through test and debug circuitry can turn design for testability (DFT) logic into a backdoor for data theft, reverse engineering, counterfeiting, and denial-of-service attacks. A compromised chip also poses a security threat to any board or system that includes that chip, and boards have their own security issues. We will provide an overview of some chip and board security concerns as they relate to DFT hardware and will briefly review several ways in which the new IEEE 1687 standard can be made more secure. We will then discuss the need for an IEEE Security Standard that can provide solutions and metrics for providing appropriate security matched to the needs of a real world environment. © 2015 IEEE. Source

Crouch A.L.,ASSET InterTech Inc.
Electronic Products (Garden City, New York) | Year: 2011

IEEE P1687 Internal JTAG (IJTAG) takes embedded test beyond its limited, chip-specific past. Embedding test and measurement instrumentation on chips is not new; it has been going on for years. What is new is how these instruments can be deployed beyond their original, limited, chip-specific purposes and applied to solve seemingly insoluble difficulties in circuit board and system-level validation, test, and debug. The intent of the IEEE P1687 standard is to streamline how embedded instruments function by defining a standardized instrument interface and an effective architecture at the chip level to access these instruments as well as to manage this access. For the first version of the IJTAG standard, the working group borrowed from the IEEE 1149.1 boundary scan (JTAG) standard for physical access to on-chip or embedded resources. The boundary scan infrastructure and controller are well established and understood by the industry; in addition, they are already present on many chips and board designs. Source

Waller R.,ASSET InterTech Inc.
Electronics World | Year: 2013

The defects caused by process variances come in a variety of shapes and sizes. Traces on boards may look fine one day and have one or more of these defects the next. Any one of these defects may or may not have an impact on serdes performance, since most designs are developed with a certain level of confidence in their operating margins, but the cumulative effects of several defects may downgrade the performance of a serdes. In addition, identifying a process that is heading towards out of specification could give the manufacturer a chance to correct the problem before it becomes disastrous. One of the big advantages of some implementations of embedded instrumentation is it can monitor serdes performance at the receiver and report test results to a software-driven external test platform. Cumbersome and less-than-effective external fixtures are avoided. In some cases, the instrumentation embedded in a board?s chips can also detect structural and functional faults. Source

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