Atsugi, Japan

Anritsu Corporation

www.anritsu.com
Atsugi, Japan

Anritsu Corporation is a Japanese company specializing in the test and measurement equipment market. Products include network call trace, service assurance, customer experience management, microwave, radio frequency , and optical signal generators, spectrum analyzers, and network analyzers. It was formed with the merger of two companies, the Annaka Corporation and Kyoritsu Electric in Japan in 1931. In 1990 Anritsu acquired Wiltron Company in the United States. Net sales in FY2008 were ¥84 billion . It has been listed on the Tokyo Stock Exchange since 1961 . As of 2009, it employed 3700 employees in 20 countries. Wikipedia.


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In a case where testing of uplink carrier aggregation that is a frequency arrangement in which a primary component carrier and a secondary component carrier are contiguous is performed, a control unit 15 causes a call processing unit 12 to configure a transmission signal of a mobile terminal 2 in such a manner that the transmission signal satisfies a prescribed condition for user data transmission, and causes a wireless signal measurement unit 13 to detect a local oscillation frequency from a band that includes a frequency band in which a primary component carrier and a secondary component carrier are contiguous, using a reception signal that satisfies the prescribed condition for user data transmission.


An optical time domain reflectometer includes: an OTDR measurement unit; an event detection unit that detects an event using the measurement result of the OTDR measurement unit; a display unit that displays a plurality of icons indicating events in an event display region A_(IV )and displays information of an event, which is located in a specific region A_(ATT )of the event display region A_(IV), in an information display region A_(INF); an operation detection unit that detects a swipe operation in the event display region A_(IV); and an event-of-interest changing unit that scrolls the events displayed in the event display region A_(IV )according to the swipe operation to change the display of the information display region A_(INF )to information corresponding to the event indicated by the icon located in the specific region A_(ATT).


A plurality of high-frequency components 12 that are provided in parallel between an input-side transmission circuit 10 and an output-side transmission circuit 11 and have pass characteristics different from each other are included, each high-frequency component 12 includes a power supply terminal 17 to which a driving power supply signal is selectively input, a signal transmitted through the input-side transmission circuit 10 is transmitted to the output-side transmission circuit 11 via a transmission path including only the high-frequency component in which the driving power supply signal is input to the power supply terminal 17 among the plurality of high-frequency components 12, and at least one of the plurality of high-frequency components 12 function as an equalizer that changes a frequency characteristic of the signal input to the input-side transmission circuit 10 due to the driving power supply signal being input to the power supply terminal 17.


Patent
Anritsu Corporation | Date: 2016-11-11

A measurement device 100 includes a measurement section 10 and the like, and the measurement section 10 includes an SA 14 that receives a signal for measuring transmission characteristics with a frequency in a predetermined frequency band from a DUT 1, an SG 15 that outputs a signal for measuring reception characteristics with a frequency in a predetermined frequency band to the DUT 1, a band storage section 16 that stores information on a frequency band handled by the measurement section 10, and a band setting section 12 that sets a frequency band handled by the SA 14 and the SG 15 on the basis of information of a frequency band handled by other measurement sections 20, 30, and 40.


Patent
Anritsu Corporation | Date: 2017-02-13

An apparatus to detect interference in wireless signals, comprising an antenna for receiving a wireless signal; and wherein the apparatus is operable to identify a dominant waveform in the received signal; subtract the dominant waveform from the received signal to create a modified received signal; and repeat the above steps, recursively substituting the modified received signal for the received signal, until all adjusted reference waveforms have been subtracted.


To minimize a measurement range when a near field measurement is performed on the directivity of a massive-MIMO antenna, and prevent the accuracy of measurement from deteriorating. Beam direction detection means 33 causes a probe antenna 12 to perform a rough scanning in a state where an electromagnetic wave radiation plane 1a of a test antenna 1 is directed toward a reference direction directly facing a measurement plane P, and detects the direction of a beam radiated by the test antenna 1 on the basis of a received signal thereof. Antenna direction change means 34 changes the direction of the test antenna so that the detected direction of a beam is directed toward the center of the measurement plane P.


Provided are a noise floor level reduction device and a noise floor level reduction method capable of reducing a noise floor level. A transmission power measurement system 10 is installed before a signal measurement device 20 including a noise floor level measurement unit 22 that measures a noise floor level, and a measurement unit 24 that subtracts the noise floor level from a level of a signal from a DUT 2 to calculate a level of a signal after subtraction, and includes an LNA 17 provided between the DUT 2 and the signal measurement device 20 for amplifying the signal from the DUT 2, and a termination resistor 16 that terminates an input of the LNA 17, and the termination resistor 16 terminates the input of the LNA 17 in a case in which the noise floor level measurement unit 22 measures the noise floor level.


Patent
Anritsu Corporation | Date: 2016-06-14

According to one embodiment, a fading simulator which conducts a fading test on a mobile communications terminal configured to receive radio signals containing respective baseband signals, includes reception modules which receive the radio signals, convert frequencies of the radio signals, and extract the baseband signals from the radio signals, respectively, reproduction processing modules which perform reproduction processing on the baseband signals extracted by the reception modules, respectively, to produce new baseband signals, a fading arithmetic module which perform fading processing on the new baseband signals produced by the reproduction processing modules individually to produce fading signals, and transmission modules which convert the fading signals produced by the fading arithmetic module into radio signals, respectively, and output the radio signals as test signals to the mobile communications terminal.


A mobile terminal testing apparatus that is capable of simulating a state where an electric wave to multiple mobile communication terminals causes interference. The mobile terminal testing apparatus includes: a scenario processing unit that controls each unit of an apparatus in order to perform each procedure for testing according to a test scenario; a cell initialization processing unit that initializes a cell that is subject to interference and an interfering cell that interferes with the cell that is subject to the interference, with a parameter for the cell that is subject to the interference, and a parameter for the interfering cell; and a cell combination processing unit that adjusts output levels of a signal of the cell that is subject to the interference and a signal of the interfering cell and performs combination in order to simulate an interference state.


Patent
Anritsu Corporation | Date: 2016-02-12

To provide an OFDR device and an OFDR method capable of measuring a large strain distribution or a large temperature distribution within a narrow measured wavelength range by using an FBG. A measured optical fiber 13 includes a plurality of gratings that is overlappingly formed in order to reflect a plurality of different wavelengths. An OFDR device 1 measures a strain distribution or a temperature distribution of the measured optical fiber 13 on the basis of the result of detection by a measuring range non-inclusion detector 26 that detects gratings of the plurality of gratings of which the reflected wavelengths are not included in the measured wavelength range from the peak wavelengths detected by a peak wavelength detector on the basis of measured wavelength range non-inclusion detecting condition data (Ds) in which a predetermined measured wavelength range is set in the direction of the axis of the peak wavelengths.

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