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Shi J.-J.,Hefei Electronic Engineering Institute | Xue L.,Hefei Electronic Engineering Institute | Xue L.,Key Laboratory of Electronic Restriction Technology of Anhui Province | Bi D.-P.,Hefei Electronic Engineering Institute | Bi D.-P.,Key Laboratory of Electronic Restriction Technology of Anhui Province
Xi Tong Gong Cheng Yu Dian Zi Ji Shu/Systems Engineering and Electronics | Year: 2010

The cross entropy theory is utilized to evaluate the jamming effects on ISAR. The concept of symmetric cross entropy is presented to compensate the shortcoming of the cross entropy in meeting symmetry, and it is a kind of distance measure proved theoretically. Then, a new evaluation model is founded by using the symmetric cross entropy as an evaluation index. In the end, two typical noise blanket jamming modes, RF noise jamming and FM noise jamming, are employed in the jamming simulation of interference with ISAR, and the symmetric cross entropy is used to quantitatively evaluate jamming effects, and the result is consistent with that of qualitative evaluation. The result also shows that the proposed method is effective and feasible. Source


Sun D.,China Institute of Technology | Sun D.,Key Laboratory of Electronic Restriction Technology of Anhui Province | Hu Y.,China Institute of Technology | Hu Y.,Key Laboratory of Electronic Restriction Technology of Anhui Province | And 2 more authors.
Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering | Year: 2013

In order to meet the demand for coated composite functional material, farinas were metallized by chemical plating copper method and their figure, infrared and microwave characteristics were tested. SEM pictures show that these metallic farinas' figures are not destroyed and their cupreous shells are symmetrical. These metallic farinas have special infrared and microwave characteristics for their shells. Because of farinas cores, these particles are lightweight. The results indicate that it is practicable to use these metallic farinas as infrared and microwave materials. Source

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