2354 Research Parkway
2354 Research Parkway
Guo S.,University of Central Florida |
Guo S.,2354 Research Parkway |
Gregory G.,University of Central Florida |
Gregory G.,2354 Research Parkway |
And 5 more authors.
Solar Energy | Year: 2017
The transmission line method (TLM) is often used in characterizing the contact resistance of c-Si solar cells by cutting cells into strips parallel to the busbars. When applying this method to industrial solar cells, we found various problems that have not been sufficiently explained in prior work. In this paper, we investigate different factors that influence the accuracy of this measurement, using both simulation and experimental methods. The following factors are shown to influence the extracted contact resistivity and are investigated in this work: (1) strip width; (2) edge shunting; (3) current flow through the intermediate unprobed fingers; (4) non-uniform contact resistance; and (5) non-uniform sheet resistance. In cases where the contact resistivity values determined from the TLM measurements and simulations were found to be inaccurate, we introduce correction procedures and measurement guidelines that reduce error. For example, when strip width is a factor, the measurement error of a 30 mm sample is reduced from 95.5% to 4.5% using a correction procedure validated by simulation. Furthermore, the methods are also shown to be very effective when applied to industrial solar cells. TLM measurements have an important role to play in both cell R&D and factory quality control, and this work can serve as a guide towards more accurate contact resistivity measurements. © 2017 Elsevier Ltd
Schneller E.J.,2354 Research Parkway |
Schneller E.J.,University of Central Florida |
Brooker R.P.,2354 Research Parkway |
Brooker R.P.,University of Central Florida |
And 17 more authors.
Renewable and Sustainable Energy Reviews | Year: 2016
This article is the third and final article in a series dedicated to reviewing each process step in crystalline silicon (c-Si) photovoltaic (PV) module manufacturing process: feedstock, crystallization and wafering, cell fabrication, and module manufacturing. The goal of these papers is to identify relevant metrology techniques that can be utilized to improve the quality and durability of the final product. The focus of this article is on the module manufacturing process. The c-Si PV module fabrication process can be divided into three primary areas; (1) stringing and tabbing, (2) lamination, and (3) integration of junction box and bypass diode(s). Each of these processing steps can impact the reliability and durability of PV modules in the field. The ultimate goal of this article is to identify appropriate metrology techniques and characterization methods that can be utilized within a module manufacturing facility to improve the reliability and durability of the final product. Additionally, a gap analysis is carried out to identify areas in need of further research and a discussion is provided that addresses new challenges for advanced materials and emerging technologies. © 2015 Elsevier Ltd.
Davis K.O.,2354 Research Parkway |
Davis K.O.,University of Central Florida |
Davis K.O.,Central College |
Walters J.,2354 Research Parkway |
And 18 more authors.
Proceedings of SPIE - The International Society for Optical Engineering | Year: 2014
In this work, the use of manufacturing metrology across the supply chain to improve crystalline silicon (c-Si) photovoltaic (PV) module reliability and durability is addressed. Additionally, an overview and summary of a recent extensive literature survey of relevant measurement techniques aimed at reducing or eliminating the probability of field failures is presented. An assessment of potential gaps is also given, wherein the PV community could benefit from new research and demonstration efforts. This review is divided into three primary areas representing different parts of the c-Si PV supply chain: (1) feedstock production, crystallization and wafering; (2) cell manufacturing; and (3) module manufacturing. © 2014 SPIE.